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Ab initio validation of continuum models parametrizations for ultrascaled SOI interfaces

Written by Biel, Blanca; Donetti, Luca; Godoy, Andrés; Gámiz, Francisco

Published in Microelectronic Engineering (286-289) September 2013.

This publication is available at http://dx.doi.org/10.1016/j.mee.2013.03.012

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